image004– installation in due progress

  • Routinely operated at 200 kV and 80 kV
  • Scanning electron microscopy module (STEM)
  • UHR objective pole piece for enhanced resolution imaging
  • Main characteristics at 200 kV
    • Cs=0.5 mm (spherical aberration coefficient)
    • Point-to-point resolution of 0.19 nm
    • Information limit of 0.1 nm
  • ThermoNoran™ energy dispersive spectrometer for chemical analysis with an energy resolution of ~133 eV (classical SiLi detector, enhanced collection angle ~0.13 sterad, take-off angle ~20 deg)
  • Tridiem Gatan™ electron energy loss spectrometer for chemical analysis with an energy resolution of ~1 eV or less.
  • JEOL Bi-Prism for electron holographic measurements with a phase resolution of ~100 mrad at medium and low magnifications
  • Dedicated specimen holders
    • Low background double tilt JEOL analytical holders