Head of the Laboratory: Dr. Larisa Burstein. Office: +972-3-640-7817. Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Scanning 5600 AES/XPS multi-technique system (PHI, USA) is a state-of-the-art analytical tool for chemical analysis of any solid material, ranging from Li to U. It can determine the chemical composition of surfaces not only by their atomic content but also by the chemical bonding of the surface atoms.

 

Head of the Laboratory: Dr. Zahava Barkay, Ph.D.  Office: +972-3-640-7818. Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

The Quanta 200 FEG Environmental Scanning Electron Microscope (ESEM) uses a field-emission gun (FEG) electron source in an exceptionally high chamber pressure environment. 

It combines two main advantages: 

  • Nanometer resolution and a high signal to noise ratio in both regular high vacuum and environmental (wet) modes.
  • Real “wet” mode (100% humidity in the specimen chamber) and a possibility to examine specimens with a high vapor pressure in the chamber. It is provided by a differential pumping vacuum system and a series of pressure-limiting apertures in addition to a patented gaseous secondary electron detector.

Head of the Laboratory: Dr. George Levi. Office: +972-3-640-9205. Email: This email address is being protected from spambots. You need JavaScript enabled to view it..

The laboratory main goal is to produce bulk sectioned specimens for analytical investigation purposes.

The laboratory utilizes high precision tools for the mechanically cutting, grinding and polishing of a wide range of solid materials. Thinned specimens are brought to electron transparency using a precision ion polishing system.

For further information including how to get access to the Lab tools please, contact the Lab Manager.

Head of the Laboratory: Dr. Zahava Barkay, Ph.D.  Office: +972-3-640-7818. Email:This email address is being protected from spambots. You need JavaScript enabled to view it.

SEMThe JSM-6300 scanning electron microscope (SEM) is basically used for surface characterization and element chemical analysis at high vacuum mode. The topics for SEM study and investigation in the center include: microelectronics, agriculture, environmental sciences, materials preparation, optics, electrochemistry, mechanics and micro-machining, and biological sciences.

 

 

Head of the Laboratory: Prof. Diana Golodnitsky. Office: +972-3-640-7820. Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Thermal Analysis

Thermal analysis is defined as a group of methods based on the determination of changes in chemical or physical properties of material as a function of temperature in a controlled atmosphere. The principal techniques of thermal analysis are differential scanning calorimetry (DSC) and dynamic thermogravimetry (TGA).

Head of the Laboraotory: Dr. Alexander Gladkikh. Office: +972-3-640-6635. Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a versatile technique, capable of analyzing both organic and inorganic surfaces including biomaterials, polymers, semiconductors, ceramics and advanced composites. TOF-SIMS allows spectroscopy for characterization of chemical composition, imaging for mapping of the surface distribution of species, and depth profiling. It combines simultaneous detection of ions over a virtually unlimited mass range, superior imaging possibilities with micron and sub-micron spatial resolution, and parts-per-million sensitivity.

Equipment

Examples of Activity

 

Head of the Laboraotoy: Dr. George Levi. Office: +972-3-640-9205. Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

The goal of our TEM Lab is to provide microstructural, morphological and chemical analysis down to sub-nanometer spatial resolution for a wide range of inorganic and organic materials and compounds.

The laboratory is currently endowed with two field emission gun TEM-s. Besides, the specimens and holders are cleaned prior to the TEM experiments using an advanced plasma cleaner system to minimize contamination induced artefacts. The required electron-transparency of the specimens is achieved by various methods, some of which are applicable in our Sample Preparation Lab.

In addition to service by the Lab dedicated experts, students and researchers meeting the requirements set by a basic, practical training course, may qualify to operate the microscopes and plasma cleaner by themselves. For further information please, contact the Lab Manager.

Head of the Laboratory: Dr. Davide Levy, Ph.D.  Office: +972-3-640-7815. Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

The X-ray diffraction is the main technique to study the crystalline matter at different level: from finding the phases in an unknown powder to a fine description of the atomic structure of a material. This technique is very versatile because can applied on different field of physics chemistry, biology and material science.

The X-ray diffraction laboratory is equipped with a Bruker D8 DISCOVER diffractometer.