Head of the Laboraotory: Dr. Alexander Gladkikh. Office: +972-3-640-6635. Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a versatile technique, capable of analyzing both organic and inorganic surfaces including biomaterials, polymers, semiconductors, ceramics and advanced composites. TOF-SIMS allows spectroscopy for characterization of chemical composition, imaging for mapping of the surface distribution of species, and depth profiling. It combines simultaneous detection of ions over a virtually unlimited mass range, superior imaging possibilities with micron and sub-micron spatial resolution, and parts-per-million sensitivity.


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